App note: How to determine if an eFuse system can be safely hot−plugged

This app note from ON Semiconductors linked here (PDF)

System designers must account for voltage surges that occur when supplies or loads are connected. eFuses are integrated circuits with many features to protect loads from these surges. However, it is important to ensure that the eFuse itself will not receive excessive voltage on its input.
This application note uses mathematical calculations, simulations, and actual lab data to illustrate the voltage surge as an eFuse is suddenly connected on the input side. System designers can use this information to make certain that the eFuse will be within its limits.

from Dangerous Prototypes

App note: Analysis of power dissipation and thermal considerations for high voltage gate drivers

App note from ON Semiconductors on ways to dissipate thermals or reduce junction temperature of HVIC. Link here (PDF)

Gate drivers used to switch MOSFETs and IGBTs at high frequencies can dissipate significant amount of power depending on the operating conditions. It is important to determine the driver power dissipation and the resulting junction temperature in the application to ensure that the part is operating within acceptable temperature limits.

from Dangerous Prototypes